High Quality Test Pattern Generation and Boolean Satisfiability - Stephan Eggersgluss - Books - Springer-Verlag New York Inc. - 9781441999757 - January 31, 2012
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Stephan Eggersgluss
High Quality Test Pattern Generation and Boolean Satisfiability 2012 edition

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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

193 pages, 52 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 31, 2012
Original release date 2011
ISBN13 9781441999757
Publishers Springer-Verlag New York Inc.
Pages 193
Dimensions 155 × 235 × 12 mm   ·   476 g
Language English  

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