Thermal Testing of Integrated Circuits - J. Altet - Books - Springer-Verlag New York Inc. - 9781402070761 - June 30, 2002
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J. Altet
Thermal Testing of Integrated Circuits 2002 edition

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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

204 pages, 102 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 30, 2002
ISBN13 9781402070761
Publishers Springer-Verlag New York Inc.
Pages 204
Dimensions 160 × 240 × 14 mm   ·   539 g
Language English  

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