X-Ray Scattering Techniques for Epitaxial Oxide Thin Films -  - Books - Springer Nature Switzerland AG - 9789819659449 - August 12, 2025
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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

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The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 12, 2025
ISBN13 9789819659449
Publishers Springer Nature Switzerland AG
Pages 186
Dimensions 150 × 220 × 20 mm   ·   453 g
Editor Evans, Paul G.
Editor Sando, Daniel
Editor Valanoor, Nagarajan

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