Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact - - Books - Springer Verlag, Singapore - 9789811661198 - November 26, 2021
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Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact 2022 edition

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311 pages, 189 Illustrations, color; 24 Illustrations, black and white; XXIII, 311 p. 213 illus., 18

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 26, 2021
ISBN13 9789811661198
Publishers Springer Verlag, Singapore
Pages 311
Dimensions 150 × 220 × 20 mm   ·   670 g
Editor Mahapatra, Souvik

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