Development of a reference database for ion beam analysis - IAEA-TECDOC Series - International Atomic Energy Agency - Books - IAEA - 9789201105158 - December 14, 2015
In case cover and title do not match, the title is correct

International Atomic Energy Agency
Development of a reference database for ion beam analysis - IAEA-TECDOC Series

Get an email once the item is available
Do you have a profile? Log in
Get notified about new International Atomic Energy Agency releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. Their reliability and accuracy depends on our knowledge of the nuclear reaction cross sections. This publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques.

226 pages, col. ill. figs, tables

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 14, 2015
ISBN13 9789201105158
Publishers IAEA
Pages 226
Dimensions 150 × 220 × 10 mm   ·   502 g   (Weight (estimated))

More by International Atomic Energy Agency

Show all

More from the same publisher

See all of International Atomic Energy Agency ( e.g. Paperback Book , Book , CD-ROM and Map )