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Ellipsometry at the Nanoscale Softcover reprint of the original 1st ed. 2013 edition
Ellipsometry at the Nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials.
730 pages, XXIV, 730 p.
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | August 23, 2016 |
| ISBN13 | 9783662519714 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 730 |
| Dimensions | 150 × 220 × 10 mm · 1.04 kg |
| Language | German |
| Editor | Hingerl, Kurt |
| Editor | Losurdo, Maria |