Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy - NanoScience and Technology - Bert Voigtlander - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783662505571 - October 13, 2016
In case cover and title do not match, the title is correct

Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy - NanoScience and Technology Softcover reprint of the original 1st ed. 2015 edition

Price
NZ$ 362.50
excl. VAT

Ordered from remote warehouse

Expected delivery Jul 27 - Aug 6
Get notified about new Bert Voigtlander releases
Add to your iMusic wish list

Not rated yet

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.


397 pages, 41 black & white illustrations, 148 colour illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 13, 2016
ISBN13 9783662505571
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 382
Dimensions 155 × 235 × 21 mm   ·   557 g
Language German  

More by Bert Voigtlander

Show all

More from the same publisher