Noncontact Atomic Force Microscopy - NanoScience and Technology - S Morita - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642627729 - October 23, 2012
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S Morita
Noncontact Atomic Force Microscopy - NanoScience and Technology Softcover reprint of the original 1st ed. 2002 edition

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

458 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 23, 2012
ISBN13 9783642627729
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 440
Dimensions 155 × 235 × 24 mm   ·   639 g
Language German  
Editor Meyer, E.
Editor Morita, S.
Editor Wiesendanger, Roland

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