Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces - Springer Series in Surface Sciences - Sascha Sadewasser - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642271137 - November 30, 2013
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Sascha Sadewasser
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces - Springer Series in Surface Sciences

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Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

290 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 30, 2013
ISBN13 9783642271137
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 334
Dimensions 156 × 236 × 23 mm   ·   485 g
Language French  
Editor Glatzel, Thilo
Editor Sadewasser, Sascha

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