Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics - Mathias Schubert - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642062285 - November 23, 2010
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Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics Softcover reprint of hardcover 1st ed. 2004 edition

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The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.


196 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 23, 2010
ISBN13 9783642062285
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 196
Dimensions 155 × 235 × 11 mm   ·   299 g
Language English  

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