Reliability and Yield in Nanoelectronics Manufacturing - Wei-Ting Kary Chien - Books - Springer Nature Switzerland AG - 9783032231895 - July 15, 2026
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Reliability and Yield in Nanoelectronics Manufacturing


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Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 15, 2026
ISBN13 9783032231895
Publishers Springer Nature Switzerland AG
Pages 506
Dimensions 150 × 220 × 20 mm   ·   790 g   (Weight (estimated))

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