Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization - Sheldon Tan - Books - Springer Nature Switzerland AG - 9783030261740 - September 25, 2020
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization 2019 edition

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460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 25, 2020
ISBN13 9783030261740
Publishers Springer Nature Switzerland AG
Pages 460
Dimensions 150 × 220 × 10 mm   ·   765 g
Language German  

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