Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection - Harland G. Tompkins - Books - Momentum Press - 9781606507278 - December 16, 2015
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Harland G. Tompkins
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection

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178 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 16, 2015
ISBN13 9781606507278
Publishers Momentum Press
Pages 178
Dimensions 150 × 220 × 10 mm   ·   267 g
Language English  

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