Advances in X-ray Analysis: Volume 20 - Mcmurdie - Books - Springer-Verlag New York Inc. - 9781461399834 - December 12, 2012
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Mcmurdie
Advances in X-ray Analysis: Volume 20 Softcover reprint of the original 1st ed. 1977 edition

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X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment.

621 pages, 171 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 12, 2012
ISBN13 9781461399834
Publishers Springer-Verlag New York Inc.
Pages 604
Dimensions 178 × 254 × 32 mm   ·   1.07 kg
Language English  
Editor McMurdie, Howard

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