Multi-Chip Module Test Strategies - Frontiers in Electronic Testing - - Books - Springer-Verlag New York Inc. - 9781461377986 - October 4, 2012
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Multi-Chip Module Test Strategies - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1997 edition

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This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.

167 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 4, 2012
ISBN13 9781461377986
Publishers Springer-Verlag New York Inc.
Pages 167
Dimensions 150 × 220 × 10 mm   ·   369 g
Language English  
Editor Zorian, Yervant

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