Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems - Tomi Laurila - Books - Springer London Ltd - 9781447124696 - January 13, 2012
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Tomi Laurila
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition

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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.

240 pages, 113 black & white illustrations, 15 colour illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 13, 2012
ISBN13 9781447124696
Publishers Springer London Ltd
Pages 218
Dimensions 155 × 235 × 18 mm   ·   453 g
Language English  

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