Reliability Prediction for Microelectronics - Quality and Reliability Engineering Series - Bernstein, Joseph B. (Ariel University, Israel) - Books - John Wiley & Sons Inc - 9781394210930 - February 27, 2024
In case cover and title do not match, the title is correct

Bernstein, Joseph B. (Ariel University, Israel)
Reliability Prediction for Microelectronics - Quality and Reliability Engineering Series 1st edition

Price
NZ$ 220
excl. VAT

Ordered from remote warehouse

Expected delivery Aug 6 - 24
Get notified about new Bernstein, Joseph B. (Ariel University, Israel) releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

384 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 27, 2024
ISBN13 9781394210930
Publishers John Wiley & Sons Inc
Pages 400
Dimensions 201 × 235 × 28 mm   ·   703 g
Language English  

More from the same publisher

See all of Bernstein, Joseph B. (Ariel University, Israel) ( e.g. Hardcover Book )