Electron Microscopy Studies of Ion Implanted Silicon - Seshan, K (University of Twente the Netherlands) - Books - Biblioscholar - 9781288822416 - February 28, 2013
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Seshan, K (University of Twente the Netherlands)
Electron Microscopy Studies of Ion Implanted Silicon

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110 pages, Illustrations, black and white

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 28, 2013
ISBN13 9781288822416
Publishers Biblioscholar
Pages 110
Dimensions 189 × 246 × 6 mm   ·   213 g

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