Characterization of Stress in Gan-On-Sapphire Microelectromechanical Systems Structures Using Micro-Raman Spectroscopy - Francisco E Parada - Books - Biblioscholar - 9781288368518 - November 29, 2012
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Characterization of Stress in Gan-On-Sapphire Microelectromechanical Systems Structures Using Micro-Raman Spectroscopy

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100 pages, Illustrations, black and white

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 29, 2012
ISBN13 9781288368518
Publishers Biblioscholar
Pages 100
Dimensions 189 × 246 × 5 mm   ·   149 g