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VLSI Fault Modeling and Testing Techniques George W. Zobrist
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VLSI Fault Modeling and Testing Techniques
George W. Zobrist
This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis models.
208 pages, 1, black & white illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | May 1, 1993 |
| ISBN13 | 9780893917814 |
| Publishers | Bloomsbury Publishing Plc |
| Pages | 200 |
| Dimensions | 160 × 230 × 17 mm · 412 g |
| Language | English |
| Editor | Zobrist, George W. |
