IDDQ Testing for CMOS and VLSI - Rochit Rajsuman - Books - Artech House Publishers - 9780890067260 - 1995
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Rochit Rajsuman
IDDQ Testing for CMOS and VLSI Unabridged edition

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Provides coverage of IDDQ testing, including discussion of the correlation between physical defects and logical faults, and how IDDQ testing detects these defects. It should be useful as a reference for designers and test engineers.

200 pages, 91ill.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released 1995
Original release date 1994
ISBN13 9780890067260
Publishers Artech House Publishers
Pages 193
Dimensions 158 × 230 × 17 mm   ·   399 g
Language English  

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