Multi-chip Module Test Strategies - Frontiers in Electronic Testing - Yervant Zorian - Books - Kluwer Academic Publishers - 9780792399209 - May 31, 1997
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Yervant Zorian
Multi-chip Module Test Strategies - Frontiers in Electronic Testing Reprinted from Journal of Electronic Testing, 10:1 edition

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This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.

167 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 31, 1997
ISBN13 9780792399209
Publishers Kluwer Academic Publishers
Pages 167
Dimensions 203 × 254 × 11 mm   ·   535 g
Language English  
Editor Zorian, Yervant

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