From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing - Jitendra B. Khare - Books - Springer - 9780792397144 - April 30, 1996
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Jitendra B. Khare
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition

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Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

150 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 30, 1996
ISBN13 9780792397144
Publishers Springer
Pages 150
Dimensions 155 × 235 × 11 mm   ·   417 g
Language English  

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