Semiconductor Device Reliability - Nato Science Series E: - Nato Advanced Research Workshop on Semiconductor Device Reliability - Books - Springer - 9780792305361 - December 31, 1989
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Nato Advanced Research Workshop on Semiconductor Device Reliability
Semiconductor Device Reliability - Nato Science Series E: 1990 edition

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Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989

575 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 31, 1989
ISBN13 9780792305361
Publishers Springer
Pages 575
Dimensions 156 × 234 × 31 mm   ·   997 g
Language English  
Editor Christou, A.
Editor Unger, B.A.

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