Semiconductor Memories: Technology, Testing, and Reliability - Ashok K. Sharma - Books - John Wiley & Sons Inc - 9780780310001 - September 10, 2002
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Ashok K. Sharma
Semiconductor Memories: Technology, Testing, and Reliability

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Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs.

480 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 10, 2002
ISBN13 9780780310001
Publishers John Wiley & Sons Inc
Pages 480
Dimensions 183 × 257 × 33 mm   ·   1.06 kg

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