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VLSI Test Symposium (VTS 2004)
Ieee
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | 2004 |
| ISBN13 | 9780769521343 |
| Publishers | IEEE Computer Society Press,U.S. |
| Pages | 550 |
| Dimensions | 150 × 220 × 10 mm · 911 g (Weight (estimated)) |
| Language | English |
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