Electron Microscopy and Analysis 2001 - Institute of Physics Conference Series - - Books - Taylor & Francis Ltd - 9780750308120 - December 1, 2001
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Electron Microscopy and Analysis 2001 - Institute of Physics Conference Series 1st edition

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Electron microscopy is a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. This book presents a useful snapshot of the developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies.

529 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 1, 2001
ISBN13 9780750308120
Publishers Taylor & Francis Ltd
Pages 529
Dimensions 163 × 242 × 36 mm   ·   940 g
Language English  
Editor Aindow, M. (University of Connecticut, USA)
Editor Kiely, C. J. (Department of Engineering, University of Liverpool, UK)

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