Focused Ion Beam Systems: Basics and Applications - Nan Yao - Books - Cambridge University Press - 9780521158596 - April 14, 2011
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Nan Yao
Focused Ion Beam Systems: Basics and Applications

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This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

408 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 14, 2011
ISBN13 9780521158596
Publishers Cambridge University Press
Pages 408
Dimensions 169 × 246 × 24 mm   ·   668 g
Language English  
Editor Yao, Nan (Princeton University, New Jersey)

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