Tell your friends about this item:
Electromigration and Electronic Device Degradation A Christou
Price
NZ$ 460
excl. VAT
Ordered from remote warehouse
Expected delivery Jul 28 - Aug 13
Get notified about new A Christou releases
Our customers say:
Add to your iMusic wish list
Electromigration and Electronic Device Degradation
A Christou
This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.
344 pages
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | January 14, 1994 |
| ISBN13 | 9780471584896 |
| Publishers | John Wiley & Sons Inc |
| Pages | 343 |
| Dimensions | 160 × 240 × 20 mm · 684 g |
| Language | English |
| Editor | Christou, Aris (CALCE Electronic Packaging Research Center, University of Maryland) |
