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Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Fangzhou Xia
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Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
Fangzhou Xia
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | February 7, 2025 |
| ISBN13 | 9783031442353 |
| Publishers | Springer International Publishing AG |
| Pages | 366 |
| Dimensions | 150 × 220 × 10 mm · 664 g |
| Language | German |